Shaun has an extensive ATE background gained whilst working at several UK semiconductor companies. He has experience on Teradyne Catalyst / A530 VNA equipped testers developed whilst delivering multi-site wafer probe and RF final test solutions for IC mass production.

Other notable platform experience gained on the LTX-Credence D10 ATE Platform for wafer probe and final test and Teradyne J750, Integra Flex, UltraFlex, J750 and Advantest 93K. Shaun has delivered test solutions for complex mixed signal transceivers and linear amplifiers utilised in Optical communications.

Shaun is currently training on the new Chroma 3680 platform with integrated RF capability.